Elements of Information Theory, Hardcover

Description

The latest edition of this classic is updated with new problem setsand material

The Second Edition of this fundamental textbook maintains thebook's tradition of clear, thought-provoking instruction. Readersare provided once again with an instructive mix of mathematics, physics, statistics, and information theory.

All the essential topics in information theory are covered indetail, including entropy, data compression, channel capacity, ratedistortion, network information theory, and hypothesis testing. Theauthors provide readers with a solid understanding of theunderlying theory and applications. Problem sets and a telegraphicsummary at the end of each chapter further assist readers. Thehistorical notes that follow each chapter recap the mainpoints.

The Second Edition features:
* Chapters reorganized to improve teaching
* 200 new problems
* New material on source coding, portfolio theory, and feedbackcapacity
* Updated references

Now current and enhanced, the Second Edition of Elements ofInformation Theory remains the ideal textbook for upper-levelundergraduate and graduate courses in electrical engineering, statistics, and telecommunications.

An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment.

About the author

THOMAS M. COVER, PHD, is Professor in the departments of electrical engineering and statistics, Stanford University. A recipient of the 1991 IEEE Claude E. Shannon Award, Dr. Cover is a past president of the IEEE Information Theory Society, a Fellow of the IEEE and the Institute of Mathematical Statistics, and a member of the National Academy of Engineering and the American Academy of Arts and Science. He has authored more than 100 technical papers and is coeditor of Open Problems in Communication and Computation.

JOY A. THOMAS, PHD, is the Chief Scientist at Stratify, Inc., a Silicon Valley start-up specializing in organizing unstructured information. After receiving his PhD at Stanford, Dr. Thomas spent more than nine years at the IBM T. J. Watson Research Center in Yorktown Heights, New York. Dr. Thomas is a recipient of the IEEE Charles LeGeyt Fortescue Fellowship.